Structural and dielectric characterization of Sm2MgMnO6
Autor: | Rudra, Moumin, Maity, Ritwik, Sinha, T. P. |
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Rok vydání: | 2017 |
Předmět: | |
Druh dokumentu: | Working Paper |
Popis: | The polycrystalline Sm2MgMnO6 (SMMO) was synthesized at 1173K by means of sol-gel technique. Rietveld refine-ment of X-ray diffraction (XRD) pattern confirmed the formation of a single phase monoclinic structure with space group P21/n. The band gap achieved from UV-vis spectra shows the semiconducting nature of the material. To observe the effect of grains and grain-boundaries in the conduction process and dielectric relaxation measurements are carried out on SMMO sample at different frequencies between 313 K and 673 K. An electrical equivalent circuit consisting of the resistance and constant phase element is used to clarify the impedance data. Comment: 5 pages, 5 figures, 2 tables |
Databáze: | arXiv |
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