| Autor: |
Wintz, Daniel, Chaudhary, Kundan, Wang, Ke, Jauregui, Luis A., Ambrosio, Antonio, Tamagnone, Michele, Zhu, Alexander Y., Devlin, Robert C., Crossno, Jesse D., Pistunova, Kateryna, Watanabe, Kenji, Taniguchi, Takashi, Kim, Philip, Capasso, Federico |
| Rok vydání: |
2017 |
| Předmět: |
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| Druh dokumentu: |
Working Paper |
| Popis: |
Guided modes in anisotropic two-dimensional van der Waals materials are experimentally investigated and their refractive indices in visible wavelengths are extracted. Our method involves near-field scanning optical microscopy of waveguide (transverse electric) and surface plasmon polariton (transverse magnetic) modes in h-BN/SiO2/Si and Ag/h-BN stacks, respectively. We determine the dispersion of these modes and use this relationship to extract anisotropic refractive indices of h-BN flakes. In the wavelength interval 550-700 nm, the in-plane and out-of-plane refractive indices are in the range 1.98-2.12 and 1.45-2.12, respectively. Our approach of using near-field scanning optical microscopy allows for direct study of interaction between light and two-dimensional van der Waals materials and heterostructures. |
| Databáze: |
arXiv |
| Externí odkaz: |
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