X-ray Fourier ptychographic microscopy
| Autor: | Simons, H., Poulsen, H. F., Guigay, J. P., Detlefs, C. |
|---|---|
| Rok vydání: | 2016 |
| Předmět: | |
| Druh dokumentu: | Working Paper |
| Popis: | Following the recent developement of Fourier ptychographic microscopy (FPM) in the visible range by Zheng et al. (2013), we propose an adaptation for hard x-rays. FPM employs ptychographic reconstruction to merge a series of low-resolution, wide field of view images into a high-resolution image. In the x-ray range this opens the possibility to overcome the limited numerical aperture of existing x-ray lenses. Furthermore, digital wave front correction (DWC) may be used to charaterize and correct lens imperfections. Given the diffraction limit achievable with x-ray lenses (below 100 nm), x-ray Fourier ptychographic microscopy (XFPM) should be able to reach resolutions in the 10 nm range. Comment: 9 pages, 1 figure |
| Databáze: | arXiv |
| Externí odkaz: |
|