A non-invasive method for nanoscale electrostatic gating of pristine materials
| Autor: | Beukman, Arjan J. A., Qu, Fanming, West, Ken W., Pfeiffer, Loren N., Kouwenhoven, Leo P. |
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| Rok vydání: | 2016 |
| Předmět: | |
| Zdroj: | Nano Letters, 2015, 15, 6883 |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1021/acs.nanolett.5b02800 |
| Popis: | Electrostatic gating is essential for defining and control of semiconducting devices. However, nano-fabrication processes required for depositing gates inevitably degrade the pristine quality of the material of interest. Examples of materials that suffer from such degradation include ultra-high mobility GaAs/AlGaAs two-dimensional electron gases (2DEGs), graphene, topological insulators, and nanowires. To preserve the pristine material properties, we have developed a flip-chip setup where gates are separated from the material by a vacuum, which allows nanoscale electrostatic gating of the material without exposing it to invasive nano-processing. An additional benefit is the vacuum between gates and material, which, unlike gate dielectrics, is free from charge traps. We demonstrate the operation and feasibility of the flip-chip setup by achieving quantum interference at integer quantum Hall states in a Fabry-P\'erot interferometer based on a GaAs/AlGaAs 2DEG. Our results pave the way for the study of exotic phenomena including fragile fractional quantum Hall states by preserving the high quality of the material. Comment: 25 pages including Supporting Information |
| Databáze: | arXiv |
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