| Autor: |
Brown, Steven J., Schlitz, Ruth A., Chabinyc, Michael L., Schuller, Jon A. |
| Rok vydání: |
2016 |
| Předmět: |
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| Druh dokumentu: |
Working Paper |
| DOI: |
10.1103/PhysRevB.94.165105 |
| Popis: |
Organic semiconductors tend to self-assemble into highly ordered and oriented morphologies with anisotropic optical properties. Studying these optical anisotropies provides insight into processing-dependent structural properties and informs the photonic design of organic photovoltaic and light-emitting devices. Here, we measure the anisotropic optical properties of spin-cast films of the n-type polymer P(NDI2OD-T2) using momentum-resolved absorption and emission spectroscopies. We quantify differences in the optical anisotropies of films deposited with distinct face-on and edge-on morphologies. In particular, we infer a substantially larger out-of-plane tilt angle of the optical transition dipole moment in high temperature annealed, edge-on films. Measurements of spectral differences between in-plane and out-of-plane dipoles, further indicate regions of disordered polymers in low temperature annealed face-on films that are otherwise obscured in traditional X-ray and optical characterization techniques. The methods and analysis developed in this work provide a way to identify and quantify subtle optical and structural anisotropies in organic semiconductors that are important for understanding and designing highly efficient thin film devices. |
| Databáze: |
arXiv |
| Externí odkaz: |
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