| Autor: |
Sergeenkov, S, Cichetto Jr, L, Zampieri, M, Longo, E, Araujo-Moreira, F M |
| Rok vydání: |
2015 |
| Předmět: |
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| Zdroj: |
Journal of Physics Condensed Matter 27, 485307 (2015) |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1088/0953-8984/27/48/485307 |
| Popis: |
We discuss the origin of the temperature dependence of resistivity observed in highly oriented LaNiO_3 thin films (of thickness d) grown on SrTiO_3 substrate by a pulsed laser deposition technique. All the experimental data are found to collapse into a single universal curve [T/T_{sf}(d)]^{3/2} for the entire temperature interval (20K
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| Databáze: |
arXiv |
| Externí odkaz: |
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