| Autor: |
Sterwerf, Christian, Meinert, Markus, Arenholz, Elke, Schmalhorst, Jan-Michael, Reiss, Günter |
| Rok vydání: |
2015 |
| Předmět: |
|
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1109/TMAG.2015.2510544 |
| Popis: |
Thin highly epitaxial BiFeO$_3$ films were prepared on SrTiO$_3$ (100) substrates by reactive magnetron co-sputtering. Detailed MOKE measurements on BiFeO$_3$/Co-Fe bilayers were performed to investigate the exchange bias as a function of the films thicknesses and Co-Fe stoichiometries. We found a maximum exchange bias of H$_{\mathrm{eb}}$=92 Oe and a coercive field of H$_{\mathrm{c}}$=89 Oe for a 12.5 nm thick BiFeO$_3$ film with a 2 nm thick Co layer. The unidirectional anisotropy is clearly visible in in-plane rotational MOKE measurements. AMR measurements reveal a strongly increasing coercivity with decreasing temperature, but no significant change in the exchange bias field. |
| Databáze: |
arXiv |
| Externí odkaz: |
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