| Autor: |
Schneider, T, Leduc, D, Cardin, J., Lupi, C, Barreau, N, Gundel, H |
| Rok vydání: |
2015 |
| Předmět: |
|
| Zdroj: |
Optical Materials, Elsevier, 2007, \<10.1016/j.optmat.2006.10.015\> |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1016/j.optmat.2006.10.015 |
| Popis: |
The optical properties of lead zirconate titanate (PZT) thin films deposited on ZnO were studied by m-lines spectroscopy. In order to retrieve the refractive index and the thickness of both layers from the m-lines spectra, we develop a numerical algorithm for the case of a two-layer system and show its robustness in the presence of noise. The sensitivity of the algorithm of the two-layer model allows us to relate the observed changes in the PZT refractive index to the PZT structural change due to the ZnO interface of the PZT/ZnO optical waveguide. |
| Databáze: |
arXiv |
| Externí odkaz: |
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