| Autor: |
Latif, Mohd Azman Abdul, Ali, Noohul Basheer Zain, Hussin, Fawnizu Azmadi, Zwolinski, Mark |
| Rok vydání: |
2015 |
| Předmět: |
|
| Druh dokumentu: |
Working Paper |
| DOI: |
10.13140/RG.2.1.5057.0965 |
| Popis: |
Burn-in is accepted as a way to evaluate ageing effects in an accelerated manner. It has been suggested that burn-in stress may have a significant effect on the Negative Bias Temperature Instability (NBTI) of subthreshold CMOS circuits. This paper analyses the effect of burn-in on NBTI in the context of a Digital to Analogue Converter (DAC) circuit. Analogue circuits require matched device pairs; NBTI may cause mismatches and hence circuit failure. The NBTI degradation observed in the simulation analysis indicates that under severe stress conditions, a significant voltage threshold mismatch in the DAC beyond the design specification of 2 mV limit can result. Experimental results confirm the sensitivity of the DAC circuit design to NBTI resulting from burn-in. |
| Databáze: |
arXiv |
| Externí odkaz: |
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