Near-field speckle-scanning-based x-ray imaging
| Autor: | Berujon, Sebastien, Ziegler, Eric |
|---|---|
| Rok vydání: | 2015 |
| Předmět: | |
| Zdroj: | Phys. Rev. A (2015) Vol. 92, Iss. 1 p. 013837 |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1103/PhysRevA.92.013837 |
| Popis: | The x-ray near-field speckle-scanning concept is an approach recently introduced to obtain absorption, phase, and dark-field images of a sample. In this paper, we present ways of recovering from a sample its ultrasmall-angle x-ray scattering distribution using numerical deconvolution. We also show how to access the 2D phase gradient signal from random step scans, the latter having the potential to elude the flat-field correction error. Each feature is explained theoretically and demonstrated experimentally at a synchrotron x-ray facility. Comment: 8 figures, 9 pages |
| Databáze: | arXiv |
| Externí odkaz: |
|