| Autor: |
van Wijk, M. M., Schuring, A., Katsnelson, M. I., Fasolino, A. |
| Rok vydání: |
2015 |
| Předmět: |
|
| Zdroj: |
2D materials 2, 034010 (2015) |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1088/2053-1583/2/3/034010 |
| Popis: |
We study the effect of atomic relaxation on the structure of moir\'e patterns in twisted graphene on graphite and double layer graphene by large scale atomistic simulations. The reconstructed structure can be described as a superlattice of `hot spots' with vortex-like behaviour of in-plane atomic displacements and increasing out-of-plane displacements with decreasing angle. These lattice distortions affect both scalar and vector potential and the resulting electronic properties. At low misorientation angles (<$\sim$1$^\circ$) the optimized structures deviate drastically from the sinusoidal modulation which is often assumed in calculations of the electronic properties. The proposed structure might be verified by scanning probe microscopy measurements. |
| Databáze: |
arXiv |
| Externí odkaz: |
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