Charge transport in amorphous Hf$_{0.5}$Zr$_{0.5}$O$_2$
Autor: | Islamov, D. R., Perevalov, T. V., Gritsenko, V. A., Cheng, C. H., Chin, A. |
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Rok vydání: | 2015 |
Předmět: | |
Zdroj: | Appl. Phys. Lett. 106 (2015) 102906 |
Druh dokumentu: | Working Paper |
DOI: | 10.1063/1.4914900 |
Popis: | In this study, we demonstrated experimentally and theoretically that the charge transport mechanism in amorphous Hf$_{0.5}$Zr$_{0.5}$O$_2$ is phonon-assisted tunneling between traps like in HfO$_2$ and ZrO$_2$. The thermal trap energy of 1.25 eV and optical trap energy of 2.5 eV in Hf$_{0.5}$Zr$_{0.5}$O$_2$ were determined based on comparison of experimental data on transport with different theories of charge transfer in dielectrics. A hypothesis that oxygen vacancies are responsible for the charge transport in Hf$_{0.5}$Zr$_{0.5}$O$_2$ was discussed. Comment: 4 pages, 3 figures, 1 table |
Databáze: | arXiv |
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