Origins of GaN(0 0 0 1) surface reconstructions
Autor: | Vezian, S., Semond, F., Massies, J., Bullock, D. W., Ding, Z., Thibado, P. M. |
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Rok vydání: | 2014 |
Předmět: | |
Zdroj: | Surface Science 541, 242 (2003) |
Druh dokumentu: | Working Paper |
DOI: | 10.1016/S0039-6028(03)00950-6 |
Popis: | The reconstructions of the Ga polarity GaN(0 0 0 1) surface with and without trace amounts of arsenic and prepared by molecular beam epitaxy (MBE) have been studied with in situ reflection high-energy electron diffraction (RHEED) and scanning tunneling microscopy (STM). Various reconstructions are observed with RHEED by analyzing patterns while the substrate is exposed to a fixed NH3 flux or after depositing known amounts of Ga as a function of substrate temperature. In situ STM images reveal that only a few of these reconstructions yield long-range periodicity in real space. The controversial role of arsenic on Ga induced reconstructions was also investigated using two independent MBE chambers and X-ray photoelectron spectroscopy. Comment: 14 pages, 7 figures |
Databáze: | arXiv |
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