| Autor: |
Boggio, J. M. Chavez, Bodenmueller, D., Fremberg, T., Haynes, R., Roth, M. M., Eisermann, R., Lisker, M., Zimmermann, L., Boehm, M. |
| Rok vydání: |
2014 |
| Předmět: |
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| Druh dokumentu: |
Working Paper |
| DOI: |
10.1364/JOSAB.31.002846 |
| Popis: |
Dispersion engineering in silicon nitride (SiX NY ) waveguides is investigated through the optimization of the waveguide transversal dimensions and refractive indices in a multi-cladding arrangement. Ultra-flat dispersion of -84.0 +/- 0.5 ps/nm/km between 1700 and 2440 nm and 1.5 +/- 3 ps/nm/km between 1670 and 2500 nm is numerically demonstrated. It is shown that typical refractive index fluctuations as well as dimension fluctuations during the fabrication of the SiX NY waveguides are a limitation for obtaining ultra-flat dispersion profiles. Single- and multi-cladding waveguides are fabricated and their dispersion profiles measured (over nearly 1000 nm) using a low-coherence frequency domain interferometric technique. By appropriate thickness optimization, the zero-dispersion wavelength is tuned over a large spectral range in both single-cladding waveguides and multi-cladding waveguides with small refractive index contrast (3 %). A flat dispersion profile with 3.2 ps/nm/km variation over 500 nm is obtained in a multi-cladding waveguide fabricated with a refractive index contrast of 37 %. Finally, we generate a nearly three-octave supercontinuum in this dispersion flattened multi-cladding SiX NY waveguide. |
| Databáze: |
arXiv |
| Externí odkaz: |
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