Membrane amplitude and triaxial stress in twisted bilayer graphene deciphered using first-principles directed elasticity theory and scanning tunneling microscopy
| Autor: | Neek-Amal, M., Xu, P., Qi, D., Thibado, P. M., Nyakiti, L. O., Wheeler, V. D., Myers-Ward, R. L., Eddy Jr., C. R., Gaskill, D. K., Peeters, F. M. |
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| Rok vydání: | 2014 |
| Předmět: | |
| Zdroj: | Phys. Rev. B 90 (6), 064101 (2014) |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1103/PhysRevB.90.064101 |
| Popis: | Twisted graphene layers produce a moir\'e pattern (MP) structure with a predetermined wavelength for given twist angle. However, predicting the membrane corrugation amplitude for any angle other than pure AB-stacked or AA-stacked graphene is impossible using first-principles density functional theory (DFT) due to the large supercell. Here, within elasticity theory we define the MP structure as the minimum energy configuration, thereby leaving the height amplitude as the only unknown parameter. The latter is determined from DFT calculations for AB and AA stacked bilayer graphene in order to eliminate all fitting parameters. Excellent agreement with scanning tunneling microscopy (STM) results across multiple substrates is reported as function of twist angle. Comment: to appear in Phys. Rev. B |
| Databáze: | arXiv |
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