| Autor: |
Schneider, Thomas, Leduc, Dominique, Lupi, Cyril, Cardin, Julien, Gundel, Hartmut, Boisrobert, Christian |
| Rok vydání: |
2014 |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics 103, 6 (2008) 063110-063110-7 |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1063/1.2885147 |
| Popis: |
We consider three layer optical waveguides and present a method to measure simultaneously the refractive index and the thickness of each layer with m-lines spectroscopy. We establish the three layer waveguide modal dispersion equations and describe a numerical method to solve these equations. The accuracy of the method is evaluated by numerical simulations with noisy data and experimentally demonstrated using a PZT thin film placed between two ZnO layers. |
| Databáze: |
arXiv |
| Externí odkaz: |
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