| Autor: |
Schaab, J., Krug, I. P., Nickel, F., Gottlob, D. M., Doğanay, H., Cano, A., Hentschel, M., Yan, Z., Bourret, E., Schneider, C. M., Ramesh, R., Meier, D. |
| Rok vydání: |
2014 |
| Předmět: |
|
| Zdroj: |
Appl. Phys. Lett. 104, 232904 (2014) |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1063/1.4879260 |
| Popis: |
High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high-spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contract-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics. |
| Databáze: |
arXiv |
| Externí odkaz: |
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