Leakage Current of a Superconductor-Normal Metal Tunnel Junction Connected to a High-Temperature Environment
| Autor: | Di Marco, A., Maisi, V. F., Pekola, J. P., Hekking, F. W. J. |
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| Rok vydání: | 2013 |
| Předmět: | |
| Zdroj: | Physical Review B 88, 174507 (2013) |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1103/PhysRevB.88.174507 |
| Popis: | We consider a voltage-biased Normal metal-Insulator-Superconductor (NIS) tunnel junction, connected to a high-temperature external electromagnetic environment. This model system features the commonly observed subgap leakage current in NIS junctions through photon-assisted tunneling which is detrimental for applications. We first consider a NIS junction directly coupled to the environment and analyze the subgap leakage current both analytically and numerically; we discuss the link with the phenomenological Dynes parameter. Then we focus on a circuit where a low-temperature lossy transmission line is inserted between the NIS junction and the environment. We show that the subgap leakage current is exponentially suppressed as the length, $\ell$, and the resistance per unit length, $R_0$, of the line are increased. We finally discuss our results in view of the performance of NIS junctions in applications. Comment: 11 pages, 9 figures |
| Databáze: | arXiv |
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