Electric Field Effect Thermoelectric Transport in Individual Silicon and Germanium/Silicon Nanowire
Autor: | Brovman, Yuri M., Small, Joshua P., Hu, Yongjie, Fang, Ying, Lieber, Charles M., Kim, Philip |
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Rok vydání: | 2013 |
Předmět: | |
Druh dokumentu: | Working Paper |
Popis: | We have simultaneously measured conductance and thermoelectric power (TEP) of individual silicon and germanium/silicon core/shell nanowires in the field effect transistor device configuration. As the applied gate voltage changes, the TEP shows distinctly different behaviors while the electrical conductance exhibits the turn-off, subthreshold, and saturation regimes respectively. At room temperature, peak TEP value of $\sim 300 \mu$V/K is observed in the subthreshold regime of the Si devices. The temperature dependence of the saturated TEP values are used to estimate the carrier doping of Si nanowires. Comment: 4 pages, 3 figures |
Databáze: | arXiv |
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