Thermoelastic study of nanolayered structures using time-resolved x-ray diffraction at high repetition rate

Autor:	Navirian, H. A., Schick, D., Gaal, P., Leitenberger, W., Shayduk, R., Bargheer, M.
Rok vydání:	2013
Předmět:	Condensed Matter - Mesoscale and Nanoscale Physics Condensed Matter - Materials Science
Druh dokumentu:	Working Paper
DOI:	10.1063/1.4861873
Popis:	We investigate the thermoelastic response of a nanolayered sample composed of a metallic SrRuO3 (SRO) electrode sandwiched between a ferroelectric Pb(Zr0.2Ti0.8)O3 (PZT) film with negative thermal expansion and a SrTiO3 substrate. SRO is rapidly heated by fs-laser pulses with 208 kHz repetition rate. Diffraction of x-ray pulses derived from a synchrotron measures the transient out-of-plane lattice constant c of all three materials simultaneously from 120 ps to 5 mus with a relative accuracy up to Delta c/c = 10^-6. The in-plane propagation of sound is essential for understanding the delayed out of plane expansion. Comment: 5 pages, 3 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/1306.4165 Zobrazit plný text záznamu View this record from Arxiv