Charge carrier dynamics in bulk MoS2 crystal studied by transient absorption microscopy
Autor: | Kumar, Nardeep, He, Jiaqi, He, Dawei, Wang, Yongsheng, Zhao, Hui |
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Rok vydání: | 2013 |
Předmět: | |
Zdroj: | J. Appl. Phys. 113, 133702 (2013) |
Druh dokumentu: | Working Paper |
DOI: | 10.1063/1.4799110 |
Popis: | We report a transient absorption microscopy study of charge carrier dynamics in bulk MoS2 crystals at room temperature. Charge carriers are injected by interband absorption of a 555-nm pulse, and probed by measuring differential reflection of a time-delayed and spatially scanned 660-nm pulse. We find an intervalley transfer time of about 0.35 ps, an energy relaxation time of hot carriers on the order of 50 ps, and a carrier lifetime of 180 ps. By monitoring the spatiotemporal dynamics of carriers, we obtained a diffusion coefficient of thermalized electrons of 4.2 cm2/s, corresponding to a mobility of 170 cm2/Vs. We also observed a time-varying diffusion coefficient of hot carriers. Comment: 6 pages, 4 figures |
Databáze: | arXiv |
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