Comparison of hot-electron transmission in ferromagnetic Ni on epitaxial and polycrystalline Schottky interfaces

Autor:	Parui, S., Rana, K. G., Bignardi, L., Rudolf, P., van Wees, B. J., Banerjee, T.
Rok vydání:	2013
Předmět:	Condensed Matter - Mesoscale and Nanoscale Physics Condensed Matter - Materials Science
Zdroj:	Physical Review B 85, 235416 (2012)
Druh dokumentu:	Working Paper
DOI:	10.1103/PhysRevB.85.235416
Popis:	The hot-electron attenuation length in Ni is measured as a function of energy across two different Schottky interfaces viz. a polycrystalline Si(111)/Au and an epitaxial Si(111)/NiSi_2 interface using ballistic electron emission microscopy (BEEM). For similarly prepared Si(111) substrates and identical Ni thickness, the BEEM transmission is found to be lower for the polycrystalline interface than for the epitaxial interface. However, in both cases, the hot-electron attenuation length in Ni is found to be the same. This is elucidated by the temperature-independent inelastic scattering, transmission probabilities across the Schottky interface, and scattering at dissimilar interfaces. Comment: 5 pages, 5 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/1302.4740 Zobrazit plný text záznamu View this record from Arxiv