Characterization of nanostructured material images using fractal descriptors

Autor:	Florindo, João B., Sikora, Mariana S., Pereira, Ernesto C., Bruno, Odemir M.
Rok vydání:	2012
Předmět:	Physics - Data Analysis Statistics and Probability Physics - Chemical Physics
Druh dokumentu:	Working Paper
DOI:	10.1016/j.physa.2012.11.020
Popis:	This work presents a methodology to the morphology analysis and characterization of nanostructured material images acquired from FEG-SEM (Field Emission Gun-Scanning Electron Microscopy) technique. The metrics were extracted from the image texture (mathematical surface) by the volumetric fractal descriptors, a methodology based on the Bouligand-Minkowski fractal dimension, which considers the properties of the Minkowski dilation of the surface points. An experiment with galvanostatic anodic titanium oxide samples prepared in oxalyc acid solution using different conditions of applied current, oxalyc acid concentration and solution temperature was performed. The results demonstrate that the approach is capable of characterizing complex morphology characteristics such as those present in the anodic titanium oxide. Comment: 8 pages, 5 figures, accepted for publication Physica A
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/1212.2677 Zobrazit plný text záznamu View this record from Arxiv