Spectrometer for Hard X-Ray Free Electron Laser Based on Diffraction Focusing
| Autor: | Kohn, V. G., Gorobtsov, O. Y., Vartanyants, I. A. |
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| Rok vydání: | 2012 |
| Předmět: | |
| Zdroj: | J. Synchrotron Rad., vol.20, part 2, 258-265 (2013) |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1107/S0909049513000903 |
| Popis: | X-ray free electron lasers (XFELs) generate sequences of ultra-short, spatially coherent pulses of x-ray radiation. We propose the diffraction focusing spectrometer (DFS), which is able to measure the whole energy spectrum of the radiation of a single XFEL pulse with an energy resolution of $\Delta E/E\approx 2\times 10^{-6}$. This is much better than for most modern x-ray spectrometers. Such resolution allows one to resolve the fine spectral structure of the XFEL pulse. The effect of diffraction focusing occurs in a single crystal plate due to dynamical scattering, and is similar to focusing in a Pendry lens made from the metamaterial with a negative refraction index. Such a spectrometer is easier to operate than those based on bent crystals. We show that the DFS can be used in a wide energy range from 5 keV to 20 keV. Comment: 9 pages, 8 figures, 2 tables |
| Databáze: | arXiv |
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