Reliable transport through a microfabricated X-junction surface-electrode ion trap
| Autor: | Wright, Kenneth, Amini, Jason M., Faircloth, Daniel L., Volin, Curtis, Doret, S. Charles, Hayden, Harley, Pai, C. -S., Landgren, David W., Denison, Douglas, Killian, Tyler, Slusher, Richart E., Harter, Alexa W. |
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| Rok vydání: | 2012 |
| Předmět: | |
| Zdroj: | New J. Phys. 15 033004 (2013) |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1088/1367-2630/15/3/033004 |
| Popis: | We report the design, fabrication, and characterization of a microfabricated surface-electrode ion trap that supports controlled transport through the two-dimensional intersection of linear trapping zones arranged in a ninety-degree cross. The trap is fabricated with very-large-scalable-integration (VLSI) techniques which are compatible with scaling to a larger quantum information processor. The shape of the radio-frequency (RF) electrodes is optimized with a genetic algorithm to minimize axial pseudopotential barriers and to minimize ion heating during transport. Seventy-eight independent DC control electrodes enable fine control of the trapping potentials. We demonstrate reliable ion transport between junction legs, trapping of ion chains with nearly-equal spacing in one of the trap's linear sections, and merging and splitting ions from these chains. Doppler-cooled ions survive more than 10^5 round-trip transits between junction legs without loss and more than sixty-five consecutive round trips without laser cooling. Comment: 13 pages, 8 figures |
| Databáze: | arXiv |
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