Magnetization of 2.6T in gadolinium thin films
| Autor: | Scheunert, G., Hendren, W. R., Ward, C., Bowman, R. M. |
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| Rok vydání: | 2012 |
| Předmět: | |
| Zdroj: | Appl. Phys. Lett. 101 142407 (2012 |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1063/1.4757126 |
| Popis: | There is renewed interest in rare-earth elements and gadolinium in particular for a range of studies in coupling physics and applications. However, it is still apparent that synthesis impacts understanding of the intrinsic magnetic properties of thin gadolinium films, particularly for thicknesses of topicality. We report studies on 50nm thick nanogranular polycrystalline gadolinium thin films on SiO2 wafers that demonstrate single-crystal like behavior. The maximum in-plane saturation magnetization at 4K was found to be 4{\pi}MS4K = (2.61{\pm}0.26)T with a coercivity of HC4K = (160{\pm}5)Oe. A maximum Curie point of TC = (293{\pm}2)K was measured via zero-field-cooled - field- cooled magnetization measurements in close agreement with values reported in bulk single crystals. Our measurements revealed magnetic transitions at T1 = (12{\pm}2)K (as deposited samples) and T2 = (22{\pm}2)K (depositions on heated substrates) possibly arising from the interaction of paramagnetic fcc grains with their ferromagnetic hcp counterparts. Comment: 14 pages, 3 figures, to be publ |
| Databáze: | arXiv |
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