Intrinsic Instability of Aberration-Corrected Electron Microscopes

Autor:	Schramm, S. M., van der Molen, S. J., Tromp, R. M.
Rok vydání:	2012
Předmět:	Physics - Instrumentation and Detectors Condensed Matter - Materials Science Condensed Matter - Other Condensed Matter
Druh dokumentu:	Working Paper
DOI:	10.1103/PhysRevLett.109.163901
Popis:	Aberration-corrected microscopes with sub-atomic resolution will impact broad areas of science and technology. However, the experimentally observed lifetime of the corrected state is just a few minutes. Here we show that the corrected state is intrinsically unstable; the higher its quality, the more unstable it is. Analyzing the Contrast Transfer Function near optimum correction, we define an 'instability budget' which allows a rational trade-off between resolution and stability. Unless control systems are developed to overcome these challenges, intrinsic instability poses a fundamental limit to the resolution practically achievable in the electron microscope. Comment: accepted, Physical Review Letters
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/1209.5340 Zobrazit plný text záznamu View this record from Arxiv