Autor: |
Hellmüller, S., Pikulski, M., Müller, T., Küng, B., Puebla-Hellmann, G., Wallraff, A., Beck, M., Ensslin, K., Ihn, T. |
Rok vydání: |
2012 |
Předmět: |
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Zdroj: |
Appl. Phys. Lett. 101, 042112 (2012) |
Druh dokumentu: |
Working Paper |
DOI: |
10.1063/1.4739248 |
Popis: |
A radio-frequency (rf) matching circuit with an in situ tunable varactor diode used for rf reflectometry measurements in semiconductor nanostructures is investigated and used to optimize the sample-specific chip design. The samples are integrated in a 2-4 GHz stub-matching circuit consisting of a waveguide stub shunted to the terminated coplanar waveguide. Several quantum point contacts fabricated on a GaAs/AlGaAs heterostructure with different chip designs are compared. We show that the change of the reflection coefficient for a fixed change in the quantum point contact conductance can be enhanced by a factor of 3 compared to conventional designs by a suitable electrode geometry. |
Databáze: |
arXiv |
Externí odkaz: |
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