Optimization of sample-chip design for stub-matched radio-frequency reflectometry measurements

Autor: Hellmüller, S., Pikulski, M., Müller, T., Küng, B., Puebla-Hellmann, G., Wallraff, A., Beck, M., Ensslin, K., Ihn, T.
Rok vydání: 2012
Předmět:
Zdroj: Appl. Phys. Lett. 101, 042112 (2012)
Druh dokumentu: Working Paper
DOI: 10.1063/1.4739248
Popis: A radio-frequency (rf) matching circuit with an in situ tunable varactor diode used for rf reflectometry measurements in semiconductor nanostructures is investigated and used to optimize the sample-specific chip design. The samples are integrated in a 2-4 GHz stub-matching circuit consisting of a waveguide stub shunted to the terminated coplanar waveguide. Several quantum point contacts fabricated on a GaAs/AlGaAs heterostructure with different chip designs are compared. We show that the change of the reflection coefficient for a fixed change in the quantum point contact conductance can be enhanced by a factor of 3 compared to conventional designs by a suitable electrode geometry.
Databáze: arXiv