Full counting statistics in a disordered free fermion system
| Autor: | Levine, G. C., Bantegui, M. J., Burg, J. A. |
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| Rok vydání: | 2012 |
| Předmět: | |
| Zdroj: | Phys. Rev. B 86, 174202 (2012) |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1103/PhysRevB.86.174202 |
| Popis: | The Full Counting Statistics (FCS) is studied for a one-dimensional system of non-interacting fermions with and without disorder. For two unbiased $L$ site lattices connected at time $t=0$, the charge variance increases as the natural logarithm of $t$, following the universal expression $<\delta N^2> \approx \frac{1}{\pi^2}\log{t}$. Since the static charge variance for a length $l$ region is given by $<\delta N^2> \approx \frac{1}{\pi^2}\log{l}$, this result reflects the underlying relativistic or conformal invariance and dynamical exponent $z=1$ of the disorder-free lattice. With disorder and strongly localized fermions, we have compared our results to a model with a dynamical exponent $z \ne 1$, and also a model for entanglement entropy based upon dynamical scaling at the Infinite Disorder Fixed Point (IDFP). The latter scaling, which predicts $<\delta N^2> \propto \log\log{t}$, appears to better describe the charge variance of disordered 1-d fermions. When a bias voltage is introduced, the behavior changes dramatically and the charge and variance become proportional to $(\log{t})^{1/\psi}$ and $\log{t}$, respectively. The exponent $\psi$ may be related to the critical exponent characterizing spatial/energy fluctuations at the IDFP. Comment: 10 pages, 14 figures; fixed typos; added references; added IDFP scaling based upon reference [1]; added finite bias section; fixed typos |
| Databáze: | arXiv |
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