| Autor: |
Fukuda, Y., Sakaki, H., Kanasaki, M., Yogo, A., Jinno, S., Tampo, M., Faenov, A. Ya., Pikuz, T. A., Hayashi, Y., Kando, M., Pirozhkov, A. S., Shimomura, T., Kiriyama, H., Kurashima, S., Kamiya, T., Oda, K., Yamauchi, T., Kondo, K., Bulanov, S. V. |
| Rok vydání: |
2011 |
| Předmět: |
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| Druh dokumentu: |
Working Paper |
| Popis: |
A new diagnosis method for high energy ions utilizing a single CR-39 detector mounted on plastic plates is demonstrated to identify the presence of the high energy component beyond the CR-39's detection threshold limit. On irradiation of the CR-39 detector unit with a 25 MeV per nucleon He ion beam from conventional rf-accelerators, a large number of etch pits having elliptical opening shapes are observed on the rear surface of the CR-39. Detailed investigations reveal that these etch pits are created by heavy ions inelastically backscattered from the plastic plates. This ion detection method is applied to laser-driven ion acceleration experiments using cluster-gas targets, and ion signals with energies up to 50 MeV per nucleon are identified. |
| Databáze: |
arXiv |
| Externí odkaz: |
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