| Autor: |
Huisman, S. R., Ctistis, G., Stobbe, S., Herek, J. L., Lodahl, P., Vos, W. L., Pinkse, P. W. H. |
| Rok vydání: |
2011 |
| Předmět: |
|
| Zdroj: |
J. Appl. Phys. 111, 033108 (2012) |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1063/1.3682105 |
| Popis: |
We perform phase-sensitive near-field scanning optical microscopy on photonic-crystal waveguides. The observed intricate field patterns are analyzed by spatial Fourier transformations, revealing several guided TE- and TM-like modes. Using the reconstruction algorithm proposed by Ha, et al. (Opt. Lett. 34 (2009)), we decompose the measured two-dimensional field pattern in a superposition of propagating Bloch modes. This opens new possibilities to study specific modes in near-field measurements. We apply the method to study the transverse behavior of a guided TE-like mode, where the mode extends deeper in the surrounding photonic crystal when the band edge is approached. |
| Databáze: |
arXiv |
| Externí odkaz: |
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