| Autor: |
Braun, A., Zhang, X., Sun, Y., Müller, U., Liu, Z., Erat, S., Ari, M., Grimmer, H., Mao, S. S., Graule, T. |
| Rok vydání: |
2011 |
| Předmět: |
|
| Zdroj: |
Applied Physics Letters 95, 022107 (2009) |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1063/1.3174916 |
| Popis: |
Reversible and irreversible discontinuities at around 573 K and 823 K in the electric conductivity of a strained 175 nm thin film of (La0.8Sr0.2)0.95Ni0.2Fe0.8O3-{\delta} grown by pulsed laser deposition on SrTiO3 (110) are reflected by valence band changes as monitored in photoemission and oxygen K-edge x-ray absorption spectra. The irreversible jump at 823 K is attributed to depletion of doped electron holes and reduction of Fe4+ to Fe3+, as evidenced by oxygen and iron core level soft x-ray spectroscopy, and possibly of a chemical origin, whereas the reversible jump at 573 K possibly originates from structural changes. |
| Databáze: |
arXiv |
| Externí odkaz: |
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