Design, Fabrication, and Experimental Demonstration of Junction Surface Ion Traps

Autor:	Moehring, D. L., Highstrete, C., Stick, D., Fortier, K. M., Haltli, R., Tigges, C., Blain, M. G.
Rok vydání:	2011
Předmět:	Quantum Physics Physics - Instrumentation and Detectors
Zdroj:	New J.Phys.13:075018,2011
Druh dokumentu:	Working Paper
DOI:	10.1088/1367-2630/13/7/075018
Popis:	We present the design, fabrication, and experimental implementation of surface ion traps with Y-shaped junctions. The traps are designed to minimize the pseudopotential variations in the junction region at the symmetric intersection of three linear segments. We experimentally demonstrate robust linear and junction shuttling with greater than one million round-trip shuttles without ion loss. By minimizing the direct line of sight between trapped ions and dielectric surfaces, negligible day-to-day and trap-to-trap variations are observed. In addition to high-fidelity single-ion shuttling, multiple-ion chains survive splitting, ion-position swapping, and recombining routines. The development of two-dimensional trapping structures is an important milestone for ion-trap quantum computing and quantum simulations. Comment: 9 pages, 6 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/1105.1834 Zobrazit plný text záznamu View this record from Arxiv