Reference-Plane Invariant Method for Measuring Electromagnetic Parameters of Materials

Autor:	Chalapat, Khattiya, Sarvala, Kari, Li, Jian, Paraoanu, G. S.
Rok vydání:	2010
Předmět:	Physics - Instrumentation and Detectors Condensed Matter - Materials Science
Zdroj:	IEEE Trans. Microwave Theor. Tech. 57:2257,2009
Druh dokumentu:	Working Paper
DOI:	10.1109/TMTT.2009.2027160
Popis:	This paper presents a simple and effective wideband method for the determination of material properties, such as the complex index of refraction and the complex permittivity and permeability. The method is explicit (non-iterative) and reference-plane invariant: it uses a certain combination of scattering parameters in conjunction with group-velocity data. This technique can be used to characterize both dielectric and magnetic materials. The proposed method is verified experimentally within a frequency range between 2 to 18 GHz on polytetrafluoroethylene and polyvinylchloride samples. A comprehensive error and stability analysis reveals that, similar to other methods based on transmission/reflection measurement, the uncertainties are larger at low frequencies and at the Fabry-Perot resonances. Comment: 12 pages, 21 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/1009.4277 Zobrazit plný text záznamu View this record from Arxiv