Scanning Tunneling Microscopy and Spectroscopy study of charge inhomogeneities in bilayer Graphene
| Autor: | Choudhary, Shyam K., Gupta, Anjan K. |
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| Rok vydání: | 2010 |
| Předmět: | |
| Zdroj: | Solid State Communications, March 2011, Volume 151, Issue 5, Pages 396-399 |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1016/j.ssc.2010.12.010 |
| Popis: | We report room temperature scanning tunneling microscopy and spectroscopy study of bilayer graphene prepared by mechanical exfoliation on SiO$_2$/Si surface and electrically contacted with gold pads using a mechanical mask. The bulk conductivity shows contribution from regions of varying electron density indicating significant charge inhomogeneity. Large scale topographic images show ripple like structures with a roughness of $\sim$1nm while the small scale atomic resolution images show graphite-like triangular lattice. Local dI/dV-V tunnel spectra have an asymmetric V-shape with the minima location showing significant spatial variation indicating inhomogeneity in electron density of order 10$^{11}$ cm-2. The minima in spectra at a fixed location also shifts linearly with the gate voltage with a slope consistent with the field induced carrier density. Comment: 5 pages, 5 figures |
| Databáze: | arXiv |
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