RASOR: An advanced instrument for soft x-ray reflectivity and diffraction

Autor:	Beale, T. A. W., Hase, T. P. A., Iida, T., Endo, K., Steadman, P., Marshall, A. R., Dhesi, S. S., van der Laan, G., Hatton, P. D.
Rok vydání:	2010
Předmět:	Condensed Matter - Strongly Correlated Electrons Physics - Instrumentation and Detectors
Zdroj:	Rev.Sci.Instrum.81:073904,2010
Druh dokumentu:	Working Paper
DOI:	10.1063/1.3458004
Popis:	We report the design and construction of a novel soft x-ray diffractometer installed at Diamond Light Source. The beamline endstation RASOR is constructed for general users and designed primarily for the study of single crystal diffraction and thin film reflectivity. The instrument is comprised of a limited three circle ({\theta}, 2{\theta}, {\chi}) diffractometer with an additional removable rotation ({\phi}) stage. It is equipped with a liquid helium cryostat, and post-scatter polarization analysis. Motorised motions are provided for the precise positioning of the sample onto the diffractometer centre of rotation, and for positioning the centre of rotation onto the x-ray beam. The functions of the instrument have been tested at Diamond Light Source, and initial test measurements are provided, demonstrating the potential of the instrument. Comment: 10 pages, 9 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/1006.4258 Zobrazit plný text záznamu View this record from Arxiv