SAXS Structural Characterization of Nanoheterogeneous Conducting Thin Films. A Brief Review of SAXS Theories
Autor: | Cattani, M., Salvadori, M. C., Teixeira, F. S. |
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Rok vydání: | 2009 |
Předmět: | |
Druh dokumentu: | Working Paper |
Popis: | The SAXS (small angle X-ray scattering) technique has been used to determine the fundamental structure of conducting thin films fabricated by implanting gold ions into PMMA (polymethylmethacrylate) polymer. We present a brief review of the SAXS theories necessary to determine the structural properties of our nanoheterogeneous films. Comment: 16 pages, no figures |
Databáze: | arXiv |
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