SAXS Structural Characterization of Nanoheterogeneous Conducting Thin Films. A Brief Review of SAXS Theories

Autor: Cattani, M., Salvadori, M. C., Teixeira, F. S.
Rok vydání: 2009
Předmět:
Druh dokumentu: Working Paper
Popis: The SAXS (small angle X-ray scattering) technique has been used to determine the fundamental structure of conducting thin films fabricated by implanting gold ions into PMMA (polymethylmethacrylate) polymer. We present a brief review of the SAXS theories necessary to determine the structural properties of our nanoheterogeneous films.
Comment: 16 pages, no figures
Databáze: arXiv