| Autor: |
Breitschaft, M., Tinkl, V., Pavlenko, N., Thiel, S., Richter, C., Kirtley, J. R., Liao, Y. C., Hammerl, G., Eyert, V., Kopp, T., Mannhart, J. |
| Rok vydání: |
2009 |
| Předmět: |
|
| Zdroj: |
Phys. Rev. B 81, 153414 (2010) |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1103/PhysRevB.81.153414 |
| Popis: |
Using tunneling spectroscopy we have measured the spectral density of states of the mobile, two-dimensional electron system generated at the LaAlO3-SrTiO3 interface. As shown by the density of states the interface electron system differs qualitatively, first, from the electron systems of the materials defining the interface and, second, from the two-dimensional electron gases formed at interfaces between conventional semiconductors. |
| Databáze: |
arXiv |
| Externí odkaz: |
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