| Autor: |
Vaknin, David, Bu, Wei, Sung, Jaeho, Jeon, Yoonnam, Kim, Doseok |
| Rok vydání: |
2009 |
| Předmět: |
|
| Zdroj: |
Journal of Physics -- Condensed Matter Vol 21, Issue 11, article Number: 115105, Published: 2009 |
| Druh dokumentu: |
Working Paper |
| DOI: |
10.1088/0953-8984/21/11/115105 |
| Popis: |
The density profiles of liquid/vapor interfaces of water-alcohol (methanol, ethanol and propanol) mixtures were studied by surface sensitive synchrotron X-ray scattering techniques. X-ray reflectivity and diffuse scattering measurements, from the pure and mixed liquids, were analyzed in the framework of capillary-wave theory to address the characteristics length-scales of the intrinsic roughness and the shortest capillary-wavelength (alternatively, the upper wave-vector cutoff in capillary wave theory). Our results establish that the intrinsic roughness is dominated by average interatomic distances. The extracted effective upper wave-vector cutoff indicates capillary wave theory breaks-down at distances on order of bulk correlation lengths. |
| Databáze: |
arXiv |
| Externí odkaz: |
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