Depth-dependent critical behavior in V2H

Autor:	Del Genio, Charo I., Trenkler, Johann, Bassler, Kevin E., Wochner, Peter, Haeffner, Dean R., Reiter, George F., Bai, Jianming, Moss, Simon C.
Rok vydání:	2009
Předmět:	Condensed Matter - Materials Science Condensed Matter - Statistical Mechanics
Zdroj:	Phys. Rev. B 79, 184113 (2009)
Druh dokumentu:	Working Paper
DOI:	10.1103/PhysRevB.79.184113
Popis:	Using X-ray diffuse scattering, we investigate the critical behavior of an order-disorder phase transition in a defective "skin-layer" of V2H. In the skin-layer, there exist walls of dislocation lines oriented normal to the surface. The density of dislocation lines within a wall decreases continuously with depth. We find that, because of this inhomogeneous distribution of defects, the transition effectively occurs at a depth-dependent local critical temperature. A depth-dependent scaling law is proposed to describe the corresponding critical ordering behavior. Comment: 5 pages, 4 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/0902.2414 Zobrazit plný text záznamu View this record from Arxiv