Depth dependent local structures in thin films unraveled by grazing incidence x-ray absorption spectroscopy

Autor:	Souza-Neto, Narcizo M., Ramos, Aline Y., Tolentino, Helio C. N., Martins, Alessandro, Santos, Antonio D.
Rok vydání:	2009
Předmět:	Condensed Matter - Materials Science
Druh dokumentu:	Working Paper
Popis:	A method of using X-ray absorption spectroscopy (XAS) together with resolved grazing incidence geometry for depth profiling atomic, electronic, chemical or magnetic local structures in thin films is presented. The quantitative deconvolution of thickness-dependent spectral features is performed by fully considering both scattering and absorption formalisms. Surface oxidation and local structural depth profiles in nanometric FePt films are determined, exemplifying the application of the method. Comment: 5 pages, 3 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/0901.4542 Zobrazit plný text záznamu View this record from Arxiv