Comparison of Resonant Inelastic X-Ray Scattering Spectra and Dielectric Loss Functions in Copper Oxides
| Autor: | Kim, Jungho, Ellis, D. S., Zhang, H., Hill, J. P., Chou, F. C., Gog, T., Casa, D., Kim, Young-June |
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| Rok vydání: | 2008 |
| Předmět: | |
| Zdroj: | Phys. Rev. B 79, 094525 (2009) |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1103/PhysRevB.79.094525 |
| Popis: | We report empirical comparisons of Cu K-edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi$_2$CuO$_4$, CuGeO$_3$, Sr$_2$Cu$_3$O$_4$Cl$_2$, La$_2$CuO$_4$, and Sr$_2$CuO$_2$Cl$_2$, and analyzed by considering both incident and scattered photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in Bi$_2$CuO$_4$ and CuGeO$_3$. Comment: 5 pages, 3 figures |
| Databáze: | arXiv |
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