Autor: |
Matsunami, M., Chainani, A., Taguchi, M., Eguchi, R., Ishida, Y., Takata, Y., Okamura, H., Nanba, T., Yabashi, M., Tamasaku, K., Nishino, Y., Ishikawa, T., Senba, Y., Ohashi, H., Ochiai, A., Shin, S. |
Rok vydání: |
2008 |
Předmět: |
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Zdroj: |
Phys. Rev. B, 78, 195118 (2008). |
Druh dokumentu: |
Working Paper |
DOI: |
10.1103/PhysRevB.78.195118 |
Popis: |
Hard x-ray photoemission and optical spectroscopies have been performed on YbS and Yb metal to determine the precise $f$-electron occupation. A comparison of the photoemission spectra with the energy loss functions in bulk and surface, obtained from optical reflectivity, enables us to distinguish between the energy loss satellite of Yb$^{2+}$ peak and Yb$^{3+}$ multiplet. The results clearly indicate a purely divalent Yb state except for the surface of YbS. We demonstrate that the present method is highly reliable in identifying the electronic structure and the mean valence in $f$-electron systems. |
Databáze: |
arXiv |
Externí odkaz: |
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