Experimental manifestation of the breakpoint region in the current-voltage characteristics of intrinsic Josephson junctions
Autor: | Irie, A., Shukrinov, Yu. M., Oya, G. |
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Rok vydání: | 2008 |
Předmět: | |
Druh dokumentu: | Working Paper |
DOI: | 10.1063/1.3005418 |
Popis: | The experimental evidence of the breakpoint on the current-voltage characteristics (IVCs) of the stacks of intrinsic Josephson junctions (IJJs) is presented. The influence of the capacitive coupling on the IVCs of Bi$_2$Sr$_2$CaCu$_2$O$_y$ IJJs has been investigated. At 4.2 K, clear breakpoint region is observed on the branches in the IVCs. It is found that the hysteresis observed on the IVC is suppressed due to the coupling compared with that expected from the McCumber parameter. Measurements agree well with the results obtained by the theoretical model. Comment: 3 pages, 4 figures |
Databáze: | arXiv |
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