Near-edge x-ray absorption fine structure investigation of graphene
| Autor: | Pacilé, D., Papagno, M., Rodríguez, A. Fraile, Grioni, M., Papagno, L., Girit, Ç. Ö., Meyer, J. C., Begtrup, G. E., Zettl, A. |
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| Rok vydání: | 2008 |
| Předmět: | |
| Druh dokumentu: | Working Paper |
| DOI: | 10.1103/PhysRevLett.101.066806 |
| Popis: | We report the near-edge x-ray absorption fine structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of Highly Ordered Pyrolytic Graphite (HOPG) on a SiO2 substrate. We utilized a PhotoEmission Electron Microscope (PEEM) to separately study single- double- and few-layers graphene (FLG) samples. In single-layer graphene we observe a splitting of the pi* resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers. Comment: 5 pages, 4 figures |
| Databáze: | arXiv |
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