Electron transport in a slot-gate Si MOSFET

Autor:	Shlimak, I., Ginodman, v., Butenko, A., Friedland, K. -J., Kravchenko, S. V.
Rok vydání:	2008
Předmět:	Condensed Matter - Mesoscale and Nanoscale Physics Condensed Matter - Strongly Correlated Electrons
Druh dokumentu:	Working Paper
DOI:	10.1209/0295-5075/82/47001
Popis:	The transversal and longitudinal resistance in the quantum Hall effect regime was measured in a Si MOSFET sample in which a slot-gate allows one to vary the electron density and filling factor in different parts of the sample. In case of unequal gate voltages, the longitudinal resistances on the opposite sides of the sample differ from each other because the originated Hall voltage difference is added to the longitudinal voltage only on one side depending on the gradient of the gate voltages and the direction of the external magnetic field. After subtracting the Hall voltage difference, the increase in longitudinal resistance is observed when electrons on the opposite sides of the slot occupy Landau levels with different spin orientations. Comment: To appear in Europhys. Lett
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/0803.4432 Zobrazit plný text záznamu View this record from Arxiv