Autor:	Casiraghi, C., Pisana, S., Novoselov, K. S., Geim, A. K., Ferrari, A. C.
Rok vydání:	2007
Předmět:	Condensed Matter - Materials Science
Zdroj:	Appl. Phys. Lett. 91, 233108 (2007)
Druh dokumentu:	Working Paper
DOI:	10.1063/1.2818692
Popis:	We report strong variations in the Raman spectra for different single-layer graphene samples obtained by micromechanical cleavage, which reveals the presence of excess charges, even in the absence of intentional doping. Doping concentrations up to ~10^13 cm-2 are estimated from the G peak shift and width, and the variation of both position and relative intensity of the second order 2D peak. Asymmetric G peaks indicate charge inhomogeneity on the scale of less than 1 micron. Comment: 3 pages, 5 figures
Databáze:	arXiv
Externí odkaz:	http://arxiv.org/abs/0709.2566 Zobrazit plný text záznamu View this record from Arxiv