X-Ray Diffraction Studies of Undoped and in-Doped Cd0.22Zn0.78S Films Deposited by Spray Pyrolysis

Autor: ÇAĞLAR, Saliha İlican, Yasemin And Müjdat, ILICAN, Saliha, ÇAĞLAR, Yasemin, ÇAĞLAR, Müjdat
Jazyk: turečtina
Rok vydání: 2014
Předmět:
Zdroj: Volume: 1, Issue: 3 85-94
Cankaya University Journal of Arts and Sciences
ISSN: 1304-7442
Popis: Cd0.22Zn0.78S and In-doped Cd0.22Zn0.78S films have been produced by the spray pyrolysismethod at 275±5°C substrate temperature. This work describes the X-ray diffraction spectra of allfilms at room temperature. X-ray diffraction spectra of the films showed that they are hexagonal andformed as Cd0.22Zn0.78S polycrystalline structure. Film thickness, texture coefficient (TC), grain sizevalues, lattice constants, and d% error were calculated. Effects of Indium incorporation on these properties deposited films have been systematically investigated.
Databáze: OpenAIRE