X-Ray Diffraction Studies of Undoped and in-Doped Cd0.22Zn0.78S Films Deposited by Spray Pyrolysis
Autor: | ÇAĞLAR, Saliha İlican, Yasemin And Müjdat, ILICAN, Saliha, ÇAĞLAR, Yasemin, ÇAĞLAR, Müjdat |
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Jazyk: | turečtina |
Rok vydání: | 2014 |
Předmět: | |
Zdroj: | Volume: 1, Issue: 3 85-94 Cankaya University Journal of Arts and Sciences |
ISSN: | 1304-7442 |
Popis: | Cd0.22Zn0.78S and In-doped Cd0.22Zn0.78S films have been produced by the spray pyrolysismethod at 275±5°C substrate temperature. This work describes the X-ray diffraction spectra of allfilms at room temperature. X-ray diffraction spectra of the films showed that they are hexagonal andformed as Cd0.22Zn0.78S polycrystalline structure. Film thickness, texture coefficient (TC), grain sizevalues, lattice constants, and d% error were calculated. Effects of Indium incorporation on these properties deposited films have been systematically investigated. |
Databáze: | OpenAIRE |
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