Aluminium corrosion in power semiconductor devices
| Autor: | J. Leppänen, J. Ingman, J.-H. Peters, M. Hanf, R. Ross, G. Koopmans, J. Jormamainen, A. Forsström, G. Ross, N. Kaminski, V. Vuorinen |
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| Rok vydání: | 2022 |
| Zdroj: | Microelectronics Reliability |
| ISSN: | 0026-2714 |
| DOI: | 10.1016/j.microrel.2022.114776 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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