| Autor: |
Elibol, Kenan, Bayer, Bernhard C., Hummel, Stefan, Kotakoski, Jani, Argentero, Giacomo, Meyer, Jannik C. |
| Jazyk: |
angličtina |
| Rok vydání: |
2016 |
| Předmět: |
|
| Zdroj: |
Scientific Reports |
| ISSN: |
2045-2322 |
| DOI: |
10.1038/srep28485 |
| Popis: |
We demonstrate the use of combined simultaneous atomic force microscopy (AFM) and laterally resolved Raman spectroscopy to study the strain distribution around highly localised deformations in suspended two-dimensional materials. Using the AFM tip as a nanoindentation probe, we induce localised strain in suspended few-layer graphene, which we adopt as a two-dimensional membrane model system. Concurrently, we visualise the strain distribution under and around the AFM tip in situ using hyperspectral Raman mapping via the strain-dependent frequency shifts of the few-layer graphene's G and 2D Raman bands. Thereby we show how the contact of the nm-sized scanning probe tip results in a two-dimensional strain field with μm dimensions in the suspended membrane. Our combined AFM/Raman approach thus adds to the critically required instrumental toolbox towards nanoscale strain engineering of two-dimensional materials. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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